[Solar: Suniva closes USD 835 million raise to expand US cell capacity to 5.5 GW]

Jordan's Energy and Minerals Regulatory Commission has issued the first 200 approvals for renewable energy installations and grid connection under the country's amended Renewable Energy and Energy Efficiency Law, covering residential and military applicants as a nationwide backlog review begins. The revised framework offers net-value, zero-export and full-export connection models and provides a regulatory basis for customers to add battery storage alongside generation. Jordan's cumulative solar capacity stood at 2,195 MW at the end of 2025.

Trinasolar will supply its Vertex N 730-735W n-type TOPCon modules for the 562 MWdc (450 MWac) Dau Tieng 5 floating solar project in Tay Ninh Province, Vietnam, developed by DT5.1 Energy of Xuan Cau Holdings and scheduled for commercial operation in December 2027 with expected annual output of about 808 GWh. The project is among the first to implement Vietnam's Direct Power Purchase Agreement (DPPA) mechanism and follows Trinasolar's 50.6 MW Dam Tra O floating project in 2020.

On September 8, the China National Intellectual Property Administration revealed that Jinko Solar Co., Ltd. has filed a patent application titled "Wafer Detection Method and Wafer Detection Apparatus." The patent abstract indicates that the application relates to the field of wafer detection technology and provides a wafer detection method and wafer detection apparatus, wherein the method includes: obtaining a first detection result of a wafer to be inspected; when the first detection result indicates a defective wafer, treating the wafer to be inspected as an initially detected abnormal wafer and obtaining detection data of the initially detected abnormal wafer; based on the detection data, determining whether a detection imaging interference source exists: if so, eliminating the detection imaging interference source and performing a secondary detection process on the initially detected abnormal wafer; if not, obtaining a second detection result of the initially detected abnormal wafer based on the detection data and a preset model; and determining, based on the second detection result, whether the initially detected abnormal wafer is a defective wafer or a qualified wafer. The technical solution provided in this application can automatically identify and correct misdetections caused by external environmental interference and other non-wafer-body defects during wafer sorting, thereby reducing wafer loss resulting from misidentifying normal, high-quality wafers as defective or substandard wafers.